High Thermal Dissipation of Normally off p-GaN Gate AlGaN/GaN HEMTs on 6-Inch N-Doped Low-Resistivity SiC Substrate

Efficient heat removal through the substrate is required in high-power operation of AlGaN/GaN high-electron-mobility transistors (HEMTs). Thus, a SiC substrate was used due to its popularity. This article reports the electrical characteristics of normally off p-GaN gate AlGaN/GaN high-electron-mobil...

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Veröffentlicht in:Micromachines (Basel) 2021-05, Vol.12 (5), p.509
Hauptverfasser: Huang, Yu-Chun, Chiu, Hsien-Chin, Kao, Hsuan-Ling, Wang, Hsiang-Chun, Liu, Chia-Hao, Huang, Chong-Rong, Chen, Si-Wen
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Sprache:eng
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Zusammenfassung:Efficient heat removal through the substrate is required in high-power operation of AlGaN/GaN high-electron-mobility transistors (HEMTs). Thus, a SiC substrate was used due to its popularity. This article reports the electrical characteristics of normally off p-GaN gate AlGaN/GaN high-electron-mobility transistors (HEMTs) on a low-resistivity SiC substrate compared with the traditional Si substrate. The p-GaN HEMTs on the SiC substrate possess several advantages, including electrical characteristics and good qualities of epitaxial crystals, especially on temperature performance. Additionally, the price of the low-resistivity SiC substrate is three times lower than the ordinary SiC substrate.
ISSN:2072-666X
2072-666X
DOI:10.3390/mi12050509