Monte Carlo-Based Random Modeling Approach for the Description and Electromagnetic Analysis of Multilayer Structures

Multilayer structures are frequently encountered in nature. Diferent techniques are available to determine the characteristics of these layers. This manuscript concerns the electromagnetic feature extraction of the multilayered properties by the inverse scattering theory approach. In this work, in order to characterize the unknown or ambiguous part of the structure, random modeling of the parameters was introduced. Monte Carlo methods are used to calculate the resultant randomness efect. The description of any parameter, including thickness, with any probability distribution function (PDF) to represent nonnegative/bounded/unbounded cases and any combination of all these parameters, is represented in a framework. Skewness and kurtosis values are added to the output structure in order to lead complex analysis on the output descriptions. As a measure of deviation from expected value, the perturbation method is also a good way to model unknowns. In this work, depending on the structure or aim of the analysis, the permittivity or the permeability of a layer is randomized. The overall refection coefficient is calculated by recursive analysis. Index Terms--Inverse scattering problems, kurtosis, Monte Carlo method (MCM), random variables, skewness.