Carrier Transport Properties of MoS2 Asymmetric Gas Sensor Under Charge Transfer-Based Barrier Modulation

Over the past few years, two-dimensional materials have gained immense attention for next-generation electric sensing devices because of their unique properties. Here, we report the carrier transport properties of MoS 2 Schottky diodes under ambient as well as gas exposure conditions. MoS 2 field-ef...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Nanoscale research letters 2018-09, Vol.13 (1), p.1-8, Article 265
Hauptverfasser: Kim, Sun Jun, Park, Jae Young, Yoo, SangHyuk, Umadevi, Palanivel, Lee, Hyunpyo, Cho, Jinsoo, Kang, Keonwook, Jun, Seong Chan
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Over the past few years, two-dimensional materials have gained immense attention for next-generation electric sensing devices because of their unique properties. Here, we report the carrier transport properties of MoS 2 Schottky diodes under ambient as well as gas exposure conditions. MoS 2 field-effect transistors (FETs) were fabricated using Pt and Al electrodes. The work function of Pt is higher than that of MoS 2, while that of Al is lower than that of MoS 2 . The MoS 2 device with Al contacts showed much higher current than that with Pt contacts because of its lower Schottky barrier height (SBH). The electrical characteristics and gas responses of the MoS 2 Schottky diodes with Al and Pt contacts were measured electrically and were simulated by density functional theory calculations. The theoretically calculated SBH of the diode (under gas absorption) showed that NO x molecules had strong interaction with the diode and induced a negative charge transfer. However, an opposite trend was observed in the case of NH 3 molecules. We also investigated the effect of metal contacts on the gas sensing performance of MoS 2 FETs both experimentally and theoretically.
ISSN:1931-7573
1556-276X
DOI:10.1186/s11671-018-2652-9