The Elusive Thomson Effect in Thermoelectric Devices. Experimental Investigation from 363 K to 213 K on Various Peltier Modules

At steady state, in the governing equation of one-stage thermoelectric cooler, the heat resulting from Fourier conduction is balanced by heat generation due to the Joule and Thomson effects inside semiconductors. Since the heat flux observed at the junction of a semiconductor, r pair includes the Pe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Metals (Basel ) 2020-02, Vol.10 (2), p.291
Hauptverfasser: Giaretto, Valter, Campagnoli, Elena
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:At steady state, in the governing equation of one-stage thermoelectric cooler, the heat resulting from Fourier conduction is balanced by heat generation due to the Joule and Thomson effects inside semiconductors. Since the heat flux observed at the junction of a semiconductor, r pair includes the Peltier effect and the Fourier heat flux caused by both the aforementioned contributions, the Thomson effect is easily masked by the Joule heat, which makes it elusive. With the aim of highlighting the contribution of the Thomson effect, measurements were carried out in the temperature range from 363 K to 213 K on different Peltier modules. The temperature dependence of the Seebeck and Thomson coefficients was evaluated as well as the electrical resistivity, and thermal conductivity of the Peltier modules examined. The results obtained show that the temperature dependence of the thermoelectric properties can reduce the cooling capacity of the Peltier module compared to what is declared in the technical datasheets of the commercial devices. The analyses allow us to conclude that an increase in the Thomson effect could have a positive effect on the performance of the Peltier only if it were possible to reduce the Joule contribution simultaneously.
ISSN:2075-4701
2075-4701
DOI:10.3390/met10020291