An epitaxial graphene platform for zero-energy edge state nanoelectronics

Graphene’s original promise to succeed silicon faltered due to pervasive edge disorder in lithographically patterned deposited graphene and the lack of a new electronics paradigm. Here we demonstrate that the annealed edges in conventionally patterned graphene epitaxially grown on a silicon carbide...

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Veröffentlicht in:Nature communications 2022-12, Vol.13 (1), p.7814-7814, Article 7814
Hauptverfasser: Prudkovskiy, Vladimir S., Hu, Yiran, Zhang, Kaimin, Hu, Yue, Ji, Peixuan, Nunn, Grant, Zhao, Jian, Shi, Chenqian, Tejeda, Antonio, Wander, David, De Cecco, Alessandro, Winkelmann, Clemens B., Jiang, Yuxuan, Zhao, Tianhao, Wakabayashi, Katsunori, Jiang, Zhigang, Ma, Lei, Berger, Claire, de Heer, Walt A.
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Sprache:eng
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Zusammenfassung:Graphene’s original promise to succeed silicon faltered due to pervasive edge disorder in lithographically patterned deposited graphene and the lack of a new electronics paradigm. Here we demonstrate that the annealed edges in conventionally patterned graphene epitaxially grown on a silicon carbide substrate (epigraphene) are stabilized by the substrate and support a protected edge state. The edge state has a mean free path that is greater than 50 microns, 5000 times greater than the bulk states and involves a theoretically unexpected Majorana-like zero-energy non-degenerate quasiparticle that does not produce a Hall voltage. In seamless integrated structures, the edge state forms a zero-energy one-dimensional ballistic network with essentially dissipationless nodes at ribbon–ribbon junctions. Seamless device structures offer a variety of switching possibilities including quantum coherent devices at low temperatures. This makes epigraphene a technologically viable graphene nanoelectronics platform that has the potential to succeed silicon nanoelectronics. Here, the authors show robust edge state transport in patterned nanoribbon networks produced on epigraphene—graphene that is epitaxially grown on non-polar faces of SiC wafers. The edge state forms a zero-energy, one-dimensional ballistic network with dissipationless nodes at ribbon–ribbon junctions.
ISSN:2041-1723
2041-1723
DOI:10.1038/s41467-022-34369-4