Digital platform of reliability management systems for operation of microgrids
This paper deals with the issue of ensuring the reliability of microsystems in the modern-day development of digital control technologies. The use of digital technologies to manage the reliability of microsystems stems from the development of various modern energy technologies with complex structure...
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Veröffentlicht in: | Energy reports 2023-11, Vol.10, p.2486-2495 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | This paper deals with the issue of ensuring the reliability of microsystems in the modern-day development of digital control technologies. The use of digital technologies to manage the reliability of microsystems stems from the development of various modern energy technologies with complex structures that require enhanced management systems to ensure their reliability. In this paper, we propose the use of digital platforms to manage the reliability of microsystems. The way digital platforms function makes it possible to automate the process of collecting, processing, and storing the necessary information about both power equipment and the operating modes of distribution networks and, in so doing, to assess and ensure the reliability of microsystems at all stages of the life cycle. In this paper, we present the main operational characteristics and principles of digital platforms. To analyze the reliability of microsystems within the framework of the functioning of digital platforms, we propose the use of machine learning methods. We suggest two algorithms for assessing the reliability of microsystems. In the first algorithm, the model is trained to analyze the regime indicators of the microsystem and, on the basis of these, to determine the reliability indicators. In the second algorithm, the model is trained to immediately determine the reliability indicators of the microsystem. Practical results have shown the effectiveness of the proposed algorithms in terms of the speed of assessing the reliability of microsystems while maintaining the required accuracy of calculations. |
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ISSN: | 2352-4847 2352-4847 |
DOI: | 10.1016/j.egyr.2023.09.048 |