The Quantification of Radiation Damage in Orthophosphates Using Confocal μ-Luminescence Spectroscopy of Nd3

In this study, we present a new concept based on the steady-state, laser-induced photoluminescence of Nd 3+ , which aims at a direct determination of the amorphous fraction f a in monazite- and xenotime-type orthophosphates on a micrometer scale. Polycrystalline, cold-pressed, sintered LaPO 4 , and...

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Veröffentlicht in:Frontiers in chemistry 2019-02, Vol.7, p.13-13
Hauptverfasser: Lenz, Christoph, Thorogood, Gordon, Aughterson, Robert, Ionescu, Mihail, Gregg, Daniel J., Davis, Joel, Lumpkin, Gregory R.
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Sprache:eng
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Zusammenfassung:In this study, we present a new concept based on the steady-state, laser-induced photoluminescence of Nd 3+ , which aims at a direct determination of the amorphous fraction f a in monazite- and xenotime-type orthophosphates on a micrometer scale. Polycrystalline, cold-pressed, sintered LaPO 4 , and YPO 4 ceramics were exposed to quadruple Au-ion irradiation with ion energies 35 MeV (50% of the respective total fluence), 22 MeV (21%), 14 MeV (16%), and 7 MeV (13%). Total irradiation fluences were varied in the range 1.6 × 10 13 –6.5 × 10 13 ions/cm 2 . Ion-irradiation resulted in amorphization and damage accumulation unto a depth of ~5 μm below the irradiated surfaces. The amorphous fraction created was quantified by means of surface-sensitive grazing-incidence X-ray diffraction and photoluminescence spectroscopy using state-of-the-art confocal spectrometers with spatial resolution in the μm range. Monazite-type LaPO 4 was found to be more susceptible to ion-irradiation induced damage accumulation than xenotime-type YPO 4 . Transmission electron microscopy of lamella cut from irradiated surfaces with the focused-ion beam technique confirmed damage depth-profiles with those obtained from PL hyperspectral mapping. Potential analytical advantages that arise from an improved characterization and quantification of radiation damage (i.e., f a ) on the μm-scale are discussed.
ISSN:2296-2646
2296-2646
DOI:10.3389/fchem.2019.00013