Behavior of A.C conductivity and Complex dielectric constant of ZnS Thin Films

The effect of temperature on dielectric properties of the prepared ZnS thin films by chemical bath deposition at film thickness (200) nm deposited at substrate temperature 333 K, was measured at frequency range (0.04-10 MHz) in the temperature range (298- 473) K .The temperature – dependent of elect...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Engineering and Technology Journal 2015-04, Vol.33 (4B), p.745-752
Hauptverfasser: Taha A, Zainab, S. Shaker, Khitam, S. Shaker, Suaad, Hameed Hani, Raghdaa
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The effect of temperature on dielectric properties of the prepared ZnS thin films by chemical bath deposition at film thickness (200) nm deposited at substrate temperature 333 K, was measured at frequency range (0.04-10 MHz) in the temperature range (298- 473) K .The temperature – dependent of electrical conductivity, the real and imaginary parts of the complex dielectric constant are calculated at the selected frequencies. The frequency exponent n, and the activation energy, Ea, are determined. The a.c. conduction mechanism of ZnS films has been explained on the basis of hopping of charge carriers.
ISSN:2412-0758
1681-6900
2412-0758
DOI:10.30684/etj.33.4B.17