High-speed electro-optic modulation in topological interface states of a one-dimensional lattice

Electro-optic modulators are key components in data communication, microwave photonics, and quantum photonics. Modulation bandwidth, energy efficiency, and device dimension are crucial metrics of modulators. Here, we provide an important direction for the miniaturization of electro-optic modulators...

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Veröffentlicht in:Light, science & applications science & applications, 2023-08, Vol.12 (1), p.206-206, Article 206
Hauptverfasser: Zhang, Yong, Shen, Jian, Li, Jingchi, Wang, Hongwei, Feng, Chenglong, Zhang, Lei, Sun, Lu, Xu, Jian, Liu, Ming, Wang, Ying, Tian, Yonghui, Dong, Jianwen, Su, Yikai
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Sprache:eng
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Zusammenfassung:Electro-optic modulators are key components in data communication, microwave photonics, and quantum photonics. Modulation bandwidth, energy efficiency, and device dimension are crucial metrics of modulators. Here, we provide an important direction for the miniaturization of electro-optic modulators by reporting on ultracompact topological modulators. A topological interface state in a one-dimensional lattice is implemented on a thin-film lithium-niobate integrated platform. Due to the strong optical confinement of the interface state and the peaking enhancement of the electro-optic response, a topological cavity with a size of 1.6 × 140 μm 2 enables a large modulation bandwidth of 104 GHz. The first topological modulator exhibits the most compact device size compared to reported LN modulators with bandwidths above 28 GHz, to the best of our knowledge. 100 Gb/s non-return-to-zero and 100 Gb/s four-level pulse amplitude modulation signals are generated. The switching energy is 5.4 fJ/bit, owing to the small electro-optic mode volume and low capacitance. The topological modulator accelerates the response time of topological photonic devices from the microsecond order to the picosecond order and provides an essential foundation for the implementation of large-scale lithium-niobate photonic integrated circuits.
ISSN:2047-7538
2095-5545
2047-7538
DOI:10.1038/s41377-023-01251-x