Sb2S3 Thickness-Related Photocurrent and Optoelectronic Processes in TiO2/Sb2S3/P3HT Planar Hybrid Solar Cells

In this work, a comprehensive understanding of the relationship of photon absorption, internal electrical field, transport path, and relative kinetics on Sb 2 S 3 photovoltaic performance has been investigated. The n-i-p planar structure for TiO 2 /Sb 2 S 3 /P3HT heterojunction hybrid solar cells wa...

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Veröffentlicht in:Nanoscale research letters 2019-10, Vol.14 (1), p.1-10, Article 325
Hauptverfasser: Wu, Fan, Pathak, Rajesh, Jiang, Lan, Chen, Weimin, Chen, Chong, Tong, Yanhua, Zhang, Tiansheng, Jian, Ronghua, Qiao, Qiquan
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Sprache:eng
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Zusammenfassung:In this work, a comprehensive understanding of the relationship of photon absorption, internal electrical field, transport path, and relative kinetics on Sb 2 S 3 photovoltaic performance has been investigated. The n-i-p planar structure for TiO 2 /Sb 2 S 3 /P3HT heterojunction hybrid solar cells was conducted, and the photon-to-electron processes including illumination depth, internal electric field, drift velocity and kinetic energy of charges, photo-generated electrons and hole concentration-related surface potential in Sb 2 S 3 , charge transport time, and interfacial charge recombination lifetime were studied to reveal the key factors that governed the device photocurrent. Dark J–V curves, Kelvin probe force microscope, and intensity-modulated photocurrent/photovoltage dynamics indicate that internal electric field is the main factors that affect the photocurrent when the Sb 2 S 3 thickness is less than the hole diffusion length. However, when the Sb 2 S 3 thickness is larger than the hole diffusion length, the inferior area in Sb 2 S 3 for holes that cannot be diffused to P3HT would become a dominant factor affecting the photocurrent. The inferior area in Sb 2 S 3 layer for hole collection could also affect the V oc of the device. The reduced collection of holes in P3HT, when the Sb 2 S 3 thickness is larger than the hole diffusion length, would increase the difference between the quasi-Fermi levels of electrons and holes for a lower V oc .
ISSN:1931-7573
1556-276X
DOI:10.1186/s11671-019-3157-x