Bottom-up construction of low-dimensional perovskite thick films for high-performance X-ray detection and imaging

Quasi-two-dimensional (Q-2D) perovskite exhibits exceptional photoelectric properties and demonstrates reduced ion migration compared to 3D perovskite, making it a promising material for the fabrication of highly sensitive and stable X-ray detectors. However, achieving high-quality perovskite films with sufficient thickness for efficient X-ray absorption remains challenging. Herein, we present a novel approach to regulate the growth of Q-2D perovskite crystals in a mixed atmosphere comprising methylamine (CH 3 NH 2 , MA) and ammonia (NH 3 ), resulting in the successful fabrication of high-quality films with a thickness of hundreds of micrometers. Subsequently, we build a heterojunction X-ray detector by incorporating the perovskite layer with titanium dioxide (TiO 2 ). The precise regulation of perovskite crystal growth and the meticulous design of the device structure synergistically enhance the resistivity and carrier transport properties of the X-ray detector, resulting in an ultrahigh sensitivity (29721.4 μC Gy air −1 cm −2 ) for low-dimensional perovskite X-ray detectors and a low detection limit of 20.9 nGy air s −1 . We have further demonstrated a flat panel X-ray imager (FPXI) showing a high spatial resolution of 3.6 lp mm −1 and outstanding X-ray imaging capability under low X-ray doses. This work presents an effective methodology for achieving high-performance Q-2D perovskite FPXIs that holds great promise for various applications in imaging technology. The quasi-two-dimensional perovskite films were successfully fabricated through a precisely controlled crystallization process by utilizing a mixed atmosphere of CH 3 NH 2 and NH 3 , resulting in the development of an ultra-sensitive perovskite/TiO 2 heterojunction X-ray detector.