Advances in the fabrication of graphene transistors on flexible substrates

Graphene is an ideal candidate for next generation applications as a transparent electrode for electronics on plastic due to its flexibility and the conservation of electrical properties upon deformation. More importantly, its field-effect tunable carrier density, high mobility and saturation veloci...

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Veröffentlicht in:Beilstein journal of nanotechnology 2017, Vol.8 (1), p.467-474
Hauptverfasser: Fisichella, Gabriele, Lo Verso, Stella, Di Marco, Silvestra, Vinciguerra, Vincenzo, Schilirò, Emanuela, Di Franco, Salvatore, Lo Nigro, Raffaella, Roccaforte, Fabrizio, Zurutuza, Amaia, Centeno, Alba, Ravesi, Sebastiano, Giannazzo, Filippo
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Sprache:eng
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Zusammenfassung:Graphene is an ideal candidate for next generation applications as a transparent electrode for electronics on plastic due to its flexibility and the conservation of electrical properties upon deformation. More importantly, its field-effect tunable carrier density, high mobility and saturation velocity make it an appealing choice as a channel material for field-effect transistors (FETs) for several potential applications. As an example, properly designed and scaled graphene FETs (Gr-FETs) can be used for flexible high frequency (RF) electronics or for high sensitivity chemical sensors. Miniaturized and flexible Gr-FET sensors would be highly advantageous for current sensors technology for in vivo and in situ applications. In this paper, we report a wafer-scale processing strategy to fabricate arrays of back-gated Gr-FETs on poly(ethylene naphthalate) (PEN) substrates. These devices present a large-area graphene channel fully exposed to the external environment, in order to be suitable for sensing applications, and the channel conductivity is efficiently modulated by a buried gate contact under a thin Al O insulating film. In order to be compatible with the use of the PEN substrate, optimized deposition conditions of the Al O film by plasma-enhanced atomic layer deposition (PE-ALD) at a low temperature (100 °C) have been developed without any relevant degradation of the final dielectric performance.
ISSN:2190-4286
2190-4286
DOI:10.3762/bjnano.8.50