Electrical properties of thin films of semiconductor solid solutions (CuInSe2)x-(2ZnSe)1-x
Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient...
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| Veröffentlicht in: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki 2019-06 (8), p.95-100 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | rus |
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| Online-Zugang: | Volltext |
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| Zusammenfassung: | Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient on the concentration of Zn atoms and the correlation between films thermal e.m.f. coefficient and their resistivity were investigated. |
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| ISSN: | 1729-7648 |