Counting on the future: fast charge-integrating detectors for X-ray nanoimaging
A fast charge‐integrating detector has been showcased for high‐resolution X‐ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction‐limited synchrotron sources for X...
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| Veröffentlicht in: | Journal of synchrotron radiation 2023-09, Vol.30 (5), p.859-860 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
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| Online-Zugang: | Volltext |
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| Zusammenfassung: | A fast charge‐integrating detector has been showcased for high‐resolution X‐ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction‐limited synchrotron sources for X‐ray nanoimaging. |
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| ISSN: | 1600-5775 0909-0495 1600-5775 |
| DOI: | 10.1107/S1600577523007269 |