Mathematical model of calibration and S-parameter measurement processes using vector network analyzer in millimeter wave band

The article describes mathematical model of calibration and S -parameter measurement processes used in millimeter wave band vector network analyzer R4-MWM-178. Assuming the specific construction of mentioned vector network analyzer the equations for calibration and measurement are provided, which al...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki 2019-06 (1), p.95-98
Hauptverfasser: A. A. Kopshai, A. V. Gusinski, A. M. Kostrikin
Format: Artikel
Sprache:rus
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The article describes mathematical model of calibration and S -parameter measurement processes used in millimeter wave band vector network analyzer R4-MWM-178. Assuming the specific construction of mentioned vector network analyzer the equations for calibration and measurement are provided, which allow to choose the optimal reference measures and implement algorithms of measurement data processing .
ISSN:1729-7648