$Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer$

Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer

In this study, we simultaneously measured the group refractive index dispersion and thickness of fused silica using a scanning white light interferometer on a spectral range from 800 to 1050 nm. A delay error correction was performed using a He-Ne laser. The accuracy of the measured group refractive...

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Veröffentlicht in:	Sensors (Basel, Switzerland) Switzerland), 2023-12, Vol.24 (1), p.17
Hauptverfasser:	Lee, Heesu, Hwang, Seungjin, Kong, Hong Jin, Hong, Kyung Hee, Yu, Tae Jun
Format:	Artikel
Sprache:	eng
Schlagworte:	Accuracy Communication Equipment and supplies Fiber optics Fourier transforms fused silica group refractive index dispersion Lasers Light Measurement Mirrors Optical instruments scanning white light interferometer Silica thickness Velocity white light interferometer
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Zusammenfassung:	In this study, we simultaneously measured the group refractive index dispersion and thickness of fused silica using a scanning white light interferometer on a spectral range from 800 to 1050 nm. A delay error correction was performed using a He-Ne laser. The accuracy of the measured group refractive index dispersion of fused silica, when compared to the temperature-dependent Sellmeier equation, is within 4 × 10 .
ISSN:	1424-8220 1424-8220
DOI:	10.3390/s24010017