Ion sputtering as methods for generation of cluster particles

The investigations of emission and fragmentation of silicon oxide clusters sputtered from Si surface have been performed. It has been shown that the processes of formation of these clusters can be qualitatively described within the framework of modern concepts, and the main channels of their formati...

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Veröffentlicht in:E3S web of conferences 2023-01, Vol.461, p.1065
Hauptverfasser: Khozhiev, Sh.T., Maksimov, S.E., Kuchkanov, Sh.K., Gaibnazarov, B.B., Yuldoshev, I.A., Kosimov, I.O., Menglieva, Sh.Yu
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Sprache:eng
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Zusammenfassung:The investigations of emission and fragmentation of silicon oxide clusters sputtered from Si surface have been performed. It has been shown that the processes of formation of these clusters can be qualitatively described within the framework of modern concepts, and the main channels of their formation are determined in accordance with the mechanism of combinatorial synthesis.
ISSN:2267-1242
2267-1242
DOI:10.1051/e3sconf/202346101065