Calibration of a single‐diode performance model without a short‐circuit temperature coefficient

We calibrate the seven parameters of a single‐diode model (SDM) for photovoltaic device performance using current‐voltage (I‐V) curves measured under controlled laboratory conditions over a matrix of nominal temperature and irradiance combinations. As described in previous modeling work, we do not use a short‐circuit temperature coefficient parameter, which depends on the often unknown insolation spectrum and whose validity may be questionable. Alternatively, we employ a rigorous temperature‐dependent extension of the spectral mismatch correction. This standard correction is routinely used by calibration laboratories to measure an effective irradiance ratio (i.e., a particular ratio of short‐circuit currents) using a calibrated reference device, thereby compensating for spectral effects of the irradiance and for any difference in spectral response between the test device and reference device. The calibrated SDM predicts the device's current at any prescribed voltage, temperature, and effective irradiance, and thus can predicts power and energy production under prescribed conditions. Our approach aligns well with the matched reference cell approach to outdoor I‐V curve measurements, while clarifying the requirements of a “matched” condition for the irradiance monitoring device(s). We find evidence for significant model discrepancy in the SDM, suggesting that model improvements and measurement intercomparisons are needed. An optimally fit surface (at 25°C) of a seven‐parameter single‐diode model calibrated to a set of I‐V curves measured over a matrix of nominal temperature T and effective irradiance ratio F levels.