Following excited-state chemical shifts in molecular ultrafast x-ray photoelectron spectroscopy

The conversion of photon energy into other energetic forms in molecules is accompanied by charge moving on ultrafast timescales. We directly observe the charge motion at a specific site in an electronically excited molecule using time-resolved x-ray photoelectron spectroscopy (TR-XPS). We extend the...

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Veröffentlicht in:Nature communications 2022-01, Vol.13 (1), p.198-198, Article 198
Hauptverfasser: Mayer, D., Lever, F., Picconi, D., Metje, J., Alisauskas, S., Calegari, F., Düsterer, S., Ehlert, C., Feifel, R., Niebuhr, M., Manschwetus, B., Kuhlmann, M., Mazza, T., Robinson, M. S., Squibb, R. J., Trabattoni, A., Wallner, M., Saalfrank, P., Wolf, T. J. A., Gühr, M.
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Sprache:eng
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Zusammenfassung:The conversion of photon energy into other energetic forms in molecules is accompanied by charge moving on ultrafast timescales. We directly observe the charge motion at a specific site in an electronically excited molecule using time-resolved x-ray photoelectron spectroscopy (TR-XPS). We extend the concept of static chemical shift from conventional XPS by the excited-state chemical shift (ESCS), which is connected to the charge in the framework of a potential model. This allows us to invert TR-XPS spectra to the dynamic charge at a specific atom. We demonstrate the power of TR-XPS by using sulphur 2 p -core-electron-emission probing to study the UV-excited dynamics of 2-thiouracil. The method allows us to discover that a major part of the population relaxes to the molecular ground state within 220–250 fs. In addition, a 250-fs oscillation, visible in the kinetic energy of the TR-XPS, reveals a coherent exchange of population among electronic states. Imaging the charge flow in photoexcited molecules would provide key information on photophysical and photochemical processes. Here the authors demonstrate tracking in real time after photoexcitation the change in charge density at a specific site of 2-thiouracil using time-resolved X-ray photoelectron spectroscopy.
ISSN:2041-1723
2041-1723
DOI:10.1038/s41467-021-27908-y