The practical application of subwavelength focusing elements in the EHF imaging system

This paper presents the results of modeling the processes of interaction of an electromagnetic wave of the EHF range with focusing elements made of materials with a refractive index n in the range from 1.2 to 2. Based on the obtained simulation results using additive technologies, an equilateral parallelepiped of acrylonitrile butadiene styrene with a refractive index was created n = 1.62. After which it was added to the EHF imaging system, and its focusing properties were analyzed. As a result of the experiments, pictures were obtained of the dependence of the intensity of electromagnetic radiation on the surface of test samples on the presence of a given focusing element in the system.