Understanding interferometry for micro-cantilever displacement detection

Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end deliverin...

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Veröffentlicht in:Beilstein journal of nanotechnology 2016, Vol.7 (1), p.841-851
Hauptverfasser: von Schmidsfeld, Alexander, Nörenberg, Tobias, Temmen, Matthias, Reichling, Michael
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Sprache:eng
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Zusammenfassung:Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber-cantilever configurations. In the Fabry-Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz(0.5) under optimum conditions.
ISSN:2190-4286
2190-4286
DOI:10.3762/bjnano.7.76