Sensitive Terahertz Detection and Imaging Driven by the Photothermoelectric Effect in Ultrashort‐Channel Black Phosphorus Devices

Terahertz (THz) photon detection is of particular appealing for myriad applications, but it still lags behind efficient manipulation with electronics and photonics due to the lack of a suitable principle satisfying both high sensitivity and fast response at room temperature. Here, a new strategy is proposed to overcome these limitations by exploring the photothermoelectric (PTE) effect in an ultrashort (down to 30 nm) channel with black phosphorus as a photoactive material. The preferential flow of hot carriers is enabled by the asymmetric Cr/Au and Ti/Au metallization with the titled‐angle evaporation technique. Most intriguingly, orders of magnitude field‐enhancement beyond the skin‐depth limit and photon absorption across a broadband frequency can be achieved. The PTE detector has excellent sensitivity of 297 V W−1, noise equivalent power less than 58 pW/Hz0.5, and response time below 0.8 ms, which is superior to other thermal‐based detectors at room temperature. A rigorous comparison with existing THz detectors, together with verification by further optical‐pumping and imaging experiments, substantiates the importance of the localized field effect in the skin‐depth limit. The results allow solid understanding on the role of PTE effect played in the THz photoresponse, opening up new opportunities for developing highly sensitive THz detectors for addressing targeted applications. A new strategy is proposed to apply the photothermoelectric (PTE) effect in an ultrashort channel using the titled‐angle evaporation technique. Such a detector exhibits tremendous field‐enhancement and high‐efficiency THz photon absorption across a broadband frequency range beyond the skin‐depth limit, introducing an avenue for deeply understanding the role of the PTE effect and targeted applications for scalable, fast imaging.