Air-stable van der Waals PtTe2 conductors with high current-carrying capacity and strong spin-orbit interaction
High-performance van der Waals (vdW) integrated electronics and spintronics require reliable current-carrying capacity. However, it is challenging to achieve high current density and air-stable performance using vdW metals owing to the fast electrical breakdown triggered by defects or oxidation. Her...
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Veröffentlicht in: | iScience 2022-11, Vol.25 (11), p.105346-105346, Article 105346 |
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Sprache: | eng |
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Zusammenfassung: | High-performance van der Waals (vdW) integrated electronics and spintronics require reliable current-carrying capacity. However, it is challenging to achieve high current density and air-stable performance using vdW metals owing to the fast electrical breakdown triggered by defects or oxidation. Here, we report that spin-orbit interacted synthetic PtTe2 layers exhibit significant electrical reliability and robustness in ambient air. The 4-nm-thick PtTe2 synthesized at a low temperature (∼400°C) shows intrinsic metallic transport behavior and a weak antilocalization effect attributed to the strong spin-orbit scattering. Remarkably, PtTe2 sustains a high current density approaching ≈31.5 MA cm−2, which is the highest value among electrical interconnect candidates under oxygen exposure. Electrical failure is caused by the Joule heating of PtTe2 rather than defect-induced electromigration, which was achievable by the native TeOx passivation. The high-quality growth of PtTe2 and the investigation of its transport behaviors lay out essential foundations for the development of emerging vdW spin-orbitronics.
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•The synthesized PtTe2 had a self-passivated surface under exposure to air•Magnetoconductance study proved the realization of a 2D confined quantum system•PtTe2 sustained a remarkably high current density (∼31.5 MA cm−2) under air atmosphere•The native TeOx passivation retarded the defect-induced electromigration of PtTe2
Condensed matter physics; Nanomaterial |
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ISSN: | 2589-0042 2589-0042 |
DOI: | 10.1016/j.isci.2022.105346 |