Tunable Nanosensor Based on Fano Resonances Created by Changing the Deviation Angle of the Metal Core in a Plasmonic Cavity

In this paper, a type of tunable plasmonic refractive index nanosensor based on Fano resonance is proposed and investigated. The sensor comprises a metal-insulator-metal (MIM) nanocavity with a center-deviated metal core and two side-coupled waveguides. By carefully adjusting the deviation angle and...

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Veröffentlicht in:Sensors (Basel, Switzerland) Switzerland), 2018-03, Vol.18 (4), p.1026
Hauptverfasser: Wang, Qiong, Ouyang, Zhengbiao, Sun, Yiling, Lin, Mi, Liu, Qiang, Zheng, Guoliang, Fan, Junxing
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Sprache:eng
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Zusammenfassung:In this paper, a type of tunable plasmonic refractive index nanosensor based on Fano resonance is proposed and investigated. The sensor comprises a metal-insulator-metal (MIM) nanocavity with a center-deviated metal core and two side-coupled waveguides. By carefully adjusting the deviation angle and distance of the metal core in the cavity, Fano resonances can be obtained and modulated. The Fano resonances can be considered as results induced by the symmetry-breaking or geometric effect that affects the field distribution intensity at the coupling region between the right waveguide and the cavity. Such a field-distribution pattern change can be regarded as being caused by the interference between the waveguide modes and the cavity modes. The investigations demonstrate that the spectral positions and modulation depths of Fano resonances are highly sensitive to the deviation parameters. Furthermore, the figure of merit (FOM) value is calculated for different deviation angle. The result shows that this kind of tunable sensor has compact structure, high transmission, sharp Fano lineshape, and high sensitivity to the change in background refractive index. This work provides an effective method for flexibly tuning Fano resonance, which has wide applications in designing on-chip plasmonic nanosensors or other relevant devices, such as information modulators, optical filters, and ultra-fast switches.
ISSN:1424-8220
1424-8220
DOI:10.3390/s18041026