Nonradiative and Radiative Recombination in CdS Polycrystalline Structures

Properties of polycrystalline CdS layers, employed in formation of the CdS-Cu2S heterostructures, have been studied by combining contactless techniques of the time and spectrally resolved photoluminescence (TR-PL) spectroscopy and microwave-probed photoconductivity (MW-PC) transients. The confocal m...

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Veröffentlicht in:Advances in Condensed Matter Physics 2013-01, Vol.2013 (2013), p.517-531
Hauptverfasser: Gaubas, E., Borschak, V., Brytavskyi, I., Čeponis, T., Dobrovolskas, D., Juršėnas, S., Kusakovskij, J., Smyntyna, V., Tamulaitis, G., Tekorius, A.
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Sprache:eng
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Zusammenfassung:Properties of polycrystalline CdS layers, employed in formation of the CdS-Cu2S heterostructures, have been studied by combining contactless techniques of the time and spectrally resolved photoluminescence (TR-PL) spectroscopy and microwave-probed photoconductivity (MW-PC) transients. The confocal microscopy has been employed to correlate the homogeneity of photoluminescence and grain size in CdS layers. Three types of samples with crystallite grain size of
ISSN:1687-8108
1687-8124
DOI:10.1155/2013/917543