Layer control of Sr1.8Bi0.2Nan-3NbnO3n+1 (n = 3–5) perovskite nanosheets: dielectric to ferroelectric transition of film deposited by Langmuir Blodgett method

Solution-based processable high-k 2-dimensional (2D) ferroelectrics have attracted significant interest for use in next-generation nanoelectronics. Although few studies on potential 2D ferroelectric nanosheets in local areas have been conducted, reports on the thin-film characteristics applicable to...

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Veröffentlicht in:NPJ 2D materials and applications 2023-08, Vol.7 (1), p.53-7, Article 53
Hauptverfasser: Yoo, So-Yeon, Yim, Haena, Ryu, Ahrom, Yoon, Chansoo, Park, Bae Ho, Nahm, Sahn, Choi, Ji-Won
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Sprache:eng
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Zusammenfassung:Solution-based processable high-k 2-dimensional (2D) ferroelectrics have attracted significant interest for use in next-generation nanoelectronics. Although few studies on potential 2D ferroelectric nanosheets in local areas have been conducted, reports on the thin-film characteristics applicable to the device are insufficient. In this study, we successfully synthesize high-k 2D Sr 1.8 Bi 0.2 Na n-3 Nb n O 3n+1 (octahedral units, n  = 3–5) nanosheets by the engineering of the n of NbO 6 octahedral layers with A-site modification, and realized ferroelectric characteristics in ultrathin films (below 10 nm). The nanosheets are synthesized by a solution-based cation exchange process and deposited using the Langmuir-Blodgett (LB) method. As increasing the NbO 6 octahedral layer, the thickness of the nanosheets increased and the band gaps are tuned to 3.80 eV ( n  = 3), 3.76 eV ( n  = 4), and 3.70 eV ( n  = 5). In addition, the dielectric permittivity of the 5-layer stacked nanofilm increase to 26 ( n  = 3), 33 ( n  = 4), and 62 ( n  = 5). In particular, the increased perovskite layer exhibits large distortions due to the size mismatch of Sr/Bi/Na ions at the A-site and promotes local ferroelectric instability due to its spontaneous polarization along the c-axis caused by an odd n number. We investigate the stable ferroelectricity in Pt/ 5-layer Sr 1.8 Bi 0.2 Na 2 Nb 5 O 16 / Nb:STO capacitor by polarization-electric field (P-E) hysteresis; the coercive electric field (E c ) was 338 kV cm −1 and the remnant polarization (P r ) 2.36 μC cm −2 . The ferroelectric properties of ultrathin 2D materials could drive interesting innovations in next-generation electronics.
ISSN:2397-7132
2397-7132
DOI:10.1038/s41699-023-00418-9