Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

Although the size effect in ferroelectric thin films has been known for long time, the underlying mechanism is not yet fully understood and whether or not there is a critical thickness below which the ferroelectricity vanishes is still under debate. Here, we directly measure the thickness-dependent...

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Veröffentlicht in:Nature communications 2017-06, Vol.8 (1), p.15549-8, Article 15549
Hauptverfasser: Gao, Peng, Zhang, Zhangyuan, Li, Mingqiang, Ishikawa, Ryo, Feng, Bin, Liu, Heng-Jui, Huang, Yen-Lin, Shibata, Naoya, Ma, Xiumei, Chen, Shulin, Zhang, Jingmin, Liu, Kaihui, Wang, En-Ge, Yu, Dapeng, Liao, Lei, Chu, Ying-Hao, Ikuhara, Yuichi
Format: Artikel
Sprache:eng
Schlagworte:
639/301/119/544
639/301/119/996
Ferroelectrics
Humanities and Social Sciences
multidisciplinary
Science
Science (multidisciplinary)
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Zusammenfassung:Although the size effect in ferroelectric thin films has been known for long time, the underlying mechanism is not yet fully understood and whether or not there is a critical thickness below which the ferroelectricity vanishes is still under debate. Here, we directly measure the thickness-dependent polarization in ultrathin PbZr 0.2 Ti 0.8 O 3 films via quantitative annular bright field imaging. We find that the polarization is significantly suppressed for films
ISSN:2041-1723
2041-1723
DOI:10.1038/ncomms15549