Current Noise of Resin Type and Cermet Type Thick Film Resistors

The current noise indices (C.N.I.) depend linearly on the logarithmic values of sheet resistivity (log⁡ ρ S ), in both carbon black/resin and thallium oxide/glass resistors, and can be expressed as C.N.I. = A + B log⁡ ρ S . The geometrical dependency on C.N.I. in both types of resistor can be expres...

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Veröffentlicht in:Active and passive electronic components 1980-01, Vol.7 (1-3), p.63-67
Hauptverfasser: Fu, Shen-Li, Shiramatsu, Toyotaro, Wu, Tien-Shou
Format: Artikel
Sprache:eng
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Zusammenfassung:The current noise indices (C.N.I.) depend linearly on the logarithmic values of sheet resistivity (log⁡ ρ S ), in both carbon black/resin and thallium oxide/glass resistors, and can be expressed as C.N.I. = A + B log⁡ ρ S . The geometrical dependency on C.N.I. in both types of resistor can be expressed as C.N.I. = A ′ − B ′ log⁡ ( L , W , T ), where A , B , A ′ and B ′ are constants. The dependency of noise e.m.f. ( ν n ) on the applied dc voltage (V), i.e., the values of α in , can be obtained from the slope of C.N.I. versus log⁡ ( L ) lines, associated with a model based on the noise generator approximation.
ISSN:0882-7516
1563-5031
DOI:10.1155/APEC.7.63