Current Noise of Resin Type and Cermet Type Thick Film Resistors
The current noise indices (C.N.I.) depend linearly on the logarithmic values of sheet resistivity (log ρ S ), in both carbon black/resin and thallium oxide/glass resistors, and can be expressed as C.N.I. = A + B log ρ S . The geometrical dependency on C.N.I. in both types of resistor can be expres...
Gespeichert in:
Veröffentlicht in: | Active and passive electronic components 1980-01, Vol.7 (1-3), p.63-67 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The current noise indices (C.N.I.) depend linearly on the logarithmic values of sheet resistivity (log ρ S ), in both carbon black/resin and thallium oxide/glass resistors, and can be expressed as C.N.I. = A + B log ρ S . The geometrical dependency on C.N.I. in both types of resistor can be expressed as C.N.I. = A ′ − B ′ log ( L , W , T ), where A , B , A ′ and B ′ are constants. The dependency of noise e.m.f. ( ν n ) on the applied dc voltage (V), i.e., the values of α in , can be obtained from the slope of C.N.I. versus log ( L ) lines, associated with a model based on the noise generator approximation. |
---|---|
ISSN: | 0882-7516 1563-5031 |
DOI: | 10.1155/APEC.7.63 |