Influence of dislocation structure on electrical and spectroscopic properties of MoOx/p-CdTe/MoOx heterostructures

Influence of dislocation structure on electrical and spectroscopic properties of MoOx/p-CdTe/MoOx heterostructures

The defective structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures were investigated by high-resolution X-wave diffractometry methods. Different models of dislocation systems were used and the dislocation densities were estimated from the Williamson-Hall plot. It is noted tha...

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Veröffentlicht in:Fìzika ì hìmìâ tverdogo tìla (Online) 2022-03, Vol.23 (1), p.144-149
Hauptverfasser: Fodchuk, I.M., Kuzmin, A.R., Maslyanchuk, O.L., Hutsuliak, I.I., Solodkyi, M.S., Roman, Yu.T., Solovan, M.M., Gudymenko, O.Yo
Format: Artikel
Sprache:eng
Schlagworte:
cadmium telluride
defect structure
heterostructures
x- and γ-radiation detectors
x-ray multiaxial diffractometry
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Zusammenfassung:The defective structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures were investigated by high-resolution X-wave diffractometry methods. Different models of dislocation systems were used and the dislocation densities were estimated from the Williamson-Hall plot. It is noted that significant deformations of the mismatch in the transition layer negatively affect the current–voltage characteristics of heterostructures.
ISSN:1729-4428
2309-8589
DOI:10.15330/pcss.23.1.144-149