Dielectric Properties of BaZr0.2[Ti(1-x)Mgx/3Ta2x/3]0.8O3 Solid Solution

BaZr 0.2 [Ti (1-x) Mg x/3 Ta 2x/3 ] 0.8 O 3 (x = 0.0, 0.05, 0.1, 0.2, 0.4, 0.6, 0.8, 1.0) (BZTMT) ceramics were prepared through conventional solid state ceramic route. The crystal structure and microstructure of the compounds were investigated respectively using XRD and SEM. The dielectric properti...

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Veröffentlicht in:Frontiers in materials 2021-05, Vol.8
Hauptverfasser: Kavil, Jithesh, Varghese, Jobin, Kovummal, Govind Raj
Format: Artikel
Sprache:eng
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Zusammenfassung:BaZr 0.2 [Ti (1-x) Mg x/3 Ta 2x/3 ] 0.8 O 3 (x = 0.0, 0.05, 0.1, 0.2, 0.4, 0.6, 0.8, 1.0) (BZTMT) ceramics were prepared through conventional solid state ceramic route. The crystal structure and microstructure of the compounds were investigated respectively using XRD and SEM. The dielectric properties were measured in the frequency range of 100 Hz–1 MHz. The ferroelectric Curie temperature of BaZr 0.2 Ti 0.8 O 3 (x = 0) shifted from 21°C to -10°C with the addition of minute amount of dopant (x = 0.025) and the paraelectric transition temperature is diffusive in nature. The relative permittivity and dielectric loss of BZTMT at 1 MHz varies from 5205 to 24 and 1.8 × 10 –2 to 2.0 × 10 –5 respectively, as the value of x increases from 0 to 1.
ISSN:2296-8016
2296-8016
DOI:10.3389/fmats.2021.664675