Time Domain Characterization of Light Trapping States in Thin Film Solar Cells

Time Domain Characterization of Light Trapping States in Thin Film Solar Cells

Spectral Interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.

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Bibliographische Detailangaben
Veröffentlicht in:EPJ Web of conferences 2013-01, Vol.41, p.8016-np
Hauptverfasser: Birlo, M., Differt, D., Lükermann, F., Pfeiffer, W., Stiebig, H.
Format: Artikel
Sprache:eng
Schlagworte:
Backscattering
Coherence
Nanostructure
Photovoltaic cells
Solar cells
Spectra
Thin films
Trapping
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Beschreibung
Zusammenfassung:Spectral Interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.
ISSN:2100-014X
2100-014X
DOI:10.1051/epjconf/20134108016