Metal chalcogenide electron extraction layers for nip-type tin-based perovskite solar cells
Tin-based perovskite solar cells have garnered attention for their biocompatibility, narrow bandgap, and long thermal carrier lifetime. However, nip -type tin-based perovskite solar cells have underperformed largely due to the indiscriminate use of metal oxide electron transport layers originally de...
Gespeichert in:
Veröffentlicht in: | Nature communications 2024-11, Vol.15 (1), p.9435-10, Article 9435 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Tin-based perovskite solar cells have garnered attention for their biocompatibility, narrow bandgap, and long thermal carrier lifetime. However,
nip
-type tin-based perovskite solar cells have underperformed largely due to the indiscriminate use of metal oxide electron transport layers originally designed for
nip
-type lead-based perovskite solar cells. Here, we reveal that this underperformance is caused by oxygen vacancies and deeper energy levels in metal oxide. To address these issues, we propose a metal chalcogenide electron transport layer, specifically Sn(S
0.92
Se
0.08
)
2
, which circumvents the oxygen molecules desorption and impedes the Sn
2+
oxidation. As a result, tin-based perovskite solar cells with Sn(S
0.92
Se
0.08
)
2
demonstrate a
V
OC
increase from 0.48 – 0.73 V and a power conversion efficiency boost from 6.98 – 11.78%. Additionally, these cells exhibit improved stability, retaining over 95% of their initial efficiency after 1632 h. Our findings showcase metal chalcogenides as promising candidates for future
nip
-type tin-based perovskite solar cell applications.
nip-Type tin-based perovskite solar cells have underperformed largely due to the metal oxide electron transport layers originally designed for lead-based devices. Here, authors employ metal chalcogenide as the electron transport layer, achieving enhanced efficiency up to 11.78% for stable devices. |
---|---|
ISSN: | 2041-1723 2041-1723 |
DOI: | 10.1038/s41467-024-53713-4 |