Optical metrology embraces deep learning: keeping an open mind
Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.
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Veröffentlicht in: | Light, science & applications science & applications, 2022-05, Vol.11 (1), p.139-139, Article 139 |
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Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits. |
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ISSN: | 2047-7538 2095-5545 2047-7538 |
DOI: | 10.1038/s41377-022-00829-1 |