Propagation of plane waves at the interface of an elastic solid half-space and a microstretch thermoelastic diffusion solid half-space

The problem of reflection and refraction phenomenon due to plane waves incident obliquely at a plane interface between uniform elastic solid half-space and microstretch thermoelastic diffusion solid half-space has been studied. It is found that the amplitude ratios of various reflected and refracted...

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Veröffentlicht in:Latin American journal of solids and structures 2013-11, Vol.10 (6), p.1081-1108
Hauptverfasser: Kumar, Rajneesh, Garg, S.K., Ahuja, Sanjeev
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Sprache:eng
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Zusammenfassung:The problem of reflection and refraction phenomenon due to plane waves incident obliquely at a plane interface between uniform elastic solid half-space and microstretch thermoelastic diffusion solid half-space has been studied. It is found that the amplitude ratios of various reflected and refracted waves are functions of angle of incidence, frequency of incident wave and are influenced by the microstretch thermoelastic diffusion properties of the media. The expressions of amplitude ratios and energy ratios are obtained in closed form. The energy ratios have been computed numerically for a particular model. The variations of energy ratios with angle of incidence are shown for thermoelastic diffusion media in the context of Lord-Shulman (L-S) (1967) and Green-Lindsay (G-L) (1972) theories. The conservation of energy at the interface is verified. Some particular cases are also deduced from the present investigation.
ISSN:1679-7825
1679-7825
DOI:10.1590/S1679-78252013000600002