All-silicon multidimensionally-encoded optical physical unclonable functions for integrated circuit anti-counterfeiting
Integrated circuit anti-counterfeiting based on optical physical unclonable functions (PUFs) plays a crucial role in guaranteeing secure identification and authentication for Internet of Things (IoT) devices. While considerable efforts have been devoted to exploring optical PUFs, two critical challe...
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Veröffentlicht in: | Nature communications 2024-04, Vol.15 (1), p.3203-3203, Article 3203 |
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Sprache: | eng |
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Zusammenfassung: | Integrated circuit anti-counterfeiting based on optical physical unclonable functions (PUFs) plays a crucial role in guaranteeing secure identification and authentication for Internet of Things (IoT) devices. While considerable efforts have been devoted to exploring optical PUFs, two critical challenges remain: incompatibility with the complementary metal-oxide-semiconductor (CMOS) technology and limited information entropy. Here, we demonstrate all-silicon multidimensionally-encoded optical PUFs fabricated by integrating silicon (Si) metasurface and erbium-doped Si quantum dots (Er-Si QDs) with a CMOS-compatible procedure. Five in-situ optical responses have been manifested within a single pixel, rendering an ultrahigh information entropy of 2.32 bits/pixel. The position-dependent optical responses originate from the position-dependent radiation field and Purcell effect. Our evaluation highlights their potential in IoT security through advanced metrics like bit uniformity, similarity, intra- and inter-Hamming distance, false-acceptance and rejection rates, and encoding capacity. We finally demonstrate the implementation of efficient lightweight mutual authentication protocols for IoT applications by using the all-Si multidimensionally-encoded optical PUFs.
The researchers introduce an all-silicon optical PUF that enhances IoT device security through CMOS-compatible fabrication, showcasing five unique optical responses per pixel for advanced authentication and high information entropy. |
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ISSN: | 2041-1723 2041-1723 |
DOI: | 10.1038/s41467-024-47479-y |