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Details on the method employed to determine film thickness from XPS measurements; the cluster models used for the IR peak assignment by DFT calculations; images showing the δNH2 vibration for aniline adsorbed in the horizontal and vertical configuration; N content on the Ru non-growth area after ani...

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Bibliographische Detailangaben
Hauptverfasser:	Merkx, M., Tezsevin, İlker, Yu, Pengmei, Janssen, Thijs, Heinemans, Rik, Lengers, Rik, Chen, Jiun-Ruey, Jezewski, Christopher, Clendenning, Scott, Kessels, W., Sandoval, Tania, Mackus, Adriaan
Format:	Dataset
Sprache:	eng
Schlagworte:	FOS: Physical sciences Physical sciences
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	Details on the method employed to determine film thickness from XPS measurements; the cluster models used for the IR peak assignment by DFT calculations; images showing the δNH2 vibration for aniline adsorbed in the horizontal and vertical configuration; N content on the Ru non-growth area after aniline adsorption at various temperatures measured by XPS.
DOI:	10.60893/figshare.jcp.25743183