Supplement Number 1

See the supplementary material for the further details on the raw sample, the schematic illustration of the DAC, the XRD experimental details, the data statistical methods, the TEM-EDS elemental mapping of the recovered sample, the method of calculating dislocation density

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Bibliographische Detailangaben
Hauptverfasser: Wang, Pan, Chen, Lianyang, Yuan, Mingzhi, Li, Jialin, Li, Wenhao, Yang, Yi, Wan, Shun, Li, Xin, Wu, Guoxia, Zhou, Xiaoling
Format: Bild
Sprache:eng
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Beschreibung
Zusammenfassung:See the supplementary material for the further details on the raw sample, the schematic illustration of the DAC, the XRD experimental details, the data statistical methods, the TEM-EDS elemental mapping of the recovered sample, the method of calculating dislocation density
DOI:10.60893/figshare.apl.27830007