Raw data of transfer characteristics in the linear regime (VDS = -10V) on log scale from Role of time-dependent foreign molecules bonding in the degradation mechanism of polymer field-effect transistors in ambient conditions

Raw data of transfer characteristics in the linear regime (VDS = -10V) on log scale from Role of time-dependent foreign molecules bonding in the degradation mechanism of polymer field-effect transistors in ambient conditions

Figure 2(c)_Transfer curves

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Bibliographische Detailangaben
Hauptverfasser: Zohaib, Muhammad, Afzal, Tahmina, Zahir Iqbal, M., Almutairi, Badriah S., Ali Raza, Mohsin, Maqsood, M. Faheem, Raza, M. Akram, Riaz, Saira, Naseem, Shahzad, Iqbal, M. Javaid
Format: Dataset
Sprache:eng
Schlagworte:
Condensed Matter Physics
FOS: Chemical sciences
FOS: Mechanical engineering
FOS: Nanotechnology
FOS: Physical sciences
Macromolecular and Materials Chemistry not elsewhere classified
Nanotechnology not elsewhere classified
Solid Mechanics
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Zusammenfassung:Figure 2(c)_Transfer curves
DOI:10.6084/m9.figshare.23151391