Data map of the photocatalytic production of hydrogen peroxide by amino-modified nitrogen-sulfur-doped carbon dots

X-ray diffraction (XRD, Apex II, Bruker X-ray diffractometer) patterns were operated to characteristic the crystal phase of samples in the range of 2θ =10-80°. The Fourier transform infrared (FT-IR) spectra were tested by a Nicolet 6700 spectrometer in the range of 4000-400 cm-1. And in-suit FT-IR spectra was tested by a Nicolet iS 10 with Drifts module. X-ray photoelectron spectroscopy (XPS) was measured by VG Multilab 2000 instrument with Al Kα source to identify the chemical states. The performed UV-Vis diffuse reflectance spectra (UV-Vis DRS) were record by Shimadzu UV-3100 spectrophotometer to detect the optical properties of the materials in the wavelength of 200 to 500 nm. The transient photocurrent density and Mott-Schottky (MS) plots were measured by Chenhua CHI 760E with three-electrode system. The photoluminescence (PL) spectra were monitored by Edinburgh FLS980 transient fluorescence spectrophotometer. Transmission electron microscope (TEM) and high-resolution TEM (HRTEM) were obtained by a FEI-Te