Dataset: The perils and pitfalls of block design for EEG classification experiments

Dataset: The perils and pitfalls of block design for EEG classification experiments

Dataset asscociated with a paper to appear in IEEE Transactions on Pattern Analysis and Machine IntelligenceThe perils and pitfalls of block design for EEG classification experiments

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Li, Ren, Johansen, Jared S., Ahmed, Hamad, Ilyevsky, Thomas V., Wilbur, Ronnie B., Bharadwaj, Hari M, Siskind, Jeffrey Mark
Format: Dataset
Sprache:eng
Schlagworte:
Artificial Intelligence
Brain
Computational Intelligence
Computer Vision
Digital signal processing
Discrete-time signal processing
EEG
Image Processing
Machine Learning
Neuroscience
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Beschreibung
Zusammenfassung:Dataset asscociated with a paper to appear in IEEE Transactions on Pattern Analysis and Machine IntelligenceThe perils and pitfalls of block design for EEG classification experiments
DOI:10.21227/r351-sz34