Dataset: The perils and pitfalls of block design for EEG classification experiments

Dataset: The perils and pitfalls of block design for EEG classification experiments

Dataset asscociated with a paper in IEEE Transactions on Pattern Analysis and Machine Intelligence"The perils and pitfalls of block design for EEG classification experiments"DOI: 10.1109/TPAMI.2020.2973153 If you use this ocde or data, please cite the above paper.

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Bibliographische Detailangaben
Hauptverfasser: Li, Ren, Johansen, Jared S., Ahmed, Hamad, Ilyevsky, Thomas V., Wilbur, Ronnie B., Bharadwaj, Hari M, Siskind, Jeffrey Mark
Format: Dataset
Sprache:eng
Schlagworte:
Artificial Intelligence
Brain
Computational Intelligence
Computer Vision
Digital signal processing
Discrete-time signal processing
EEG
Image Processing
Machine Learning
Neuroscience
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Beschreibung
Zusammenfassung:Dataset asscociated with a paper in IEEE Transactions on Pattern Analysis and Machine Intelligence"The perils and pitfalls of block design for EEG classification experiments"DOI: 10.1109/TPAMI.2020.2973153 If you use this ocde or data, please cite the above paper.
DOI:10.21227/p93w-v959