Dataset: The perils and pitfalls of block design for EEG classification experiments

Dataset asscociated with a paper to appear in IEEE Transactions on Pattern Analysis and Machine Intelligence"The perils and pitfalls of block design for EEG classification experiments"The paper has been accepted and is in production.We will upload the dataset when the paper is published.Th...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Li, Ren, Johansen, Jared S., Ahmed, Hamad, Ilyevsky, Thomas V., Wilbur, Ronnie B., Bharadwaj, Hari M, Siskind, Jeffrey Mark
Format: Dataset
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:Dataset asscociated with a paper to appear in IEEE Transactions on Pattern Analysis and Machine Intelligence"The perils and pitfalls of block design for EEG classification experiments"The paper has been accepted and is in production.We will upload the dataset when the paper is published.This is a placeholder so we can obtain a DOI to include in the paper.
DOI:10.21227/9t12-pf70