Data for: Dual-Response and Li+-Insertion Induced Phase Transition of VO2-based Smart Windows for Selective Visible and Near-Infrared Light Transmittance Modulation
Raman scattering measurements (Renishaw, in Via, λ = 532 nm) were conducted for phase identification. The thickness of the multilayer films were shown in cross-section micrographs by field-emission scanning electron microscope (FESEM, FEI Magellan 400). Lastly, UV/vis/NIR Spectrophotometer (Hitachi,...
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Zusammenfassung: | Raman scattering measurements (Renishaw, in Via, λ = 532 nm) were conducted for phase identification. The thickness of the multilayer films were shown in cross-section micrographs by field-emission scanning electron microscope (FESEM, FEI Magellan 400). Lastly, UV/vis/NIR Spectrophotometer (Hitachi, UV-4100, ranging from 350 to 2600 nm) was used to characterize the transmittances spectra of the multilayer films with the scanning speed of 120nm/min. |
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DOI: | 10.17632/xgbk37tk85.1 |