Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE

Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE

These are the dataset of the Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE measurements performed at the microanalytical center at Josef Stefan Institute at Ljubljana, Slovenia.

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Bibliographische Detailangaben
1. Verfasser: Ebrahim Gholami Hatam
Format: Dataset
Sprache:eng
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Zusammenfassung:These are the dataset of the Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE measurements performed at the microanalytical center at Josef Stefan Institute at Ljubljana, Slovenia.
DOI:10.17632/wc392364jc.1