Variable-range electron hopping, conductivity cross-over and space-charge relaxation in C60Br6

[Display omitted] •The electronic conductivity of solid C60Br6 obeys Mott’s variable-range hopping below 215K, with a typical hopping range of the order of the molecular radius.•A conductivity cross-over is observed at 215K, likely due to a solid-solid transition.•A structured space-charge relaxatio...

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Veröffentlicht in:Synthetic metals 2016-07, Vol.217, p.123-128
Hauptverfasser: Zachariah, Manesh, Romanini, Michela, Zygouri, Panagiota, Gournis, Dimitrios, Tamarit, Josep Lluís, Barrio, Maria, Macovez, Roberto
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Sprache:eng
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Zusammenfassung:[Display omitted] •The electronic conductivity of solid C60Br6 obeys Mott’s variable-range hopping below 215K, with a typical hopping range of the order of the molecular radius.•A conductivity cross-over is observed at 215K, likely due to a solid-solid transition.•A structured space-charge relaxation loss is observed by dielectric spectroscopy, possibly due to the existence of two different inhomogeneity lengthscales.•The main relaxation feature obeys the Barton-Nakajima-Namikawa condition. Dielectric spectroscopy is employed to probe the frequency-dependent conductivity and dipolar dielectric response of solid C60Br6. Below approximately 215K, charge conduction is electronic and well described by Mott’s variable-range polaron hopping model, with effective hopping activation energy Ea varying between 0.12eV at 125K and 0.16eV at 220K, and most probable hopping range varying between 100 and 125% of the decay length of the localized polaron’s wavefunction. Above 215K a new contribution appears in the conductivity, accompanied by a weak endothermic feature in the calorimetric thermogram, which might signal a solid-solid phase transition. A broad dielectric loss feature is observed in the imaginary part of the permittivity. Such feature stems largely from a conductivity-related frequency-dependent loss associated with polaron hopping, as confirmed by the validity of the Barton-Nakajima-Namikawa condition.
ISSN:0379-6779
1879-3290
DOI:10.1016/j.synthmet.2016.03.028