SRAM lifetime improvement by using adaptive proactive reconfiguration
Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced...
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| creator | Pouyan, Peyman Amat Bertran, Esteve Rubio Sola, Jose Antonio |
| description | Modern generations of CMOS technology nodes
are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging,
and effectively enlarges the SRAM lifetime.
Peer Reviewed |
| format | Text Resource |
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are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging,
and effectively enlarges the SRAM lifetime.
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are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging,
and effectively enlarges the SRAM lifetime.
Peer Reviewed</description><subject>Circuits integrats</subject><subject>Electrònica</subject><subject>Enginyeria electrònica</subject><subject>Integrated circuits</subject><subject>Microelectrònica</subject><subject>Àrees temàtiques de la UPC</subject><isbn>8362954434</isbn><isbn>9788362954438</isbn><fulltext>true</fulltext><rsrctype>text_resource</rsrctype><creationdate>2012</creationdate><recordtype>text_resource</recordtype><sourceid>XX2</sourceid><recordid>eNpjZuCyMDYzsjQ1MTE24WRwDQ5y9FXIyUxLLcnMTVXIzC0oyi9LzU3NK1FIqlQoLc7MS1dITEksKMksS1UAyiUmg1lFqcn5eWmZ6aVFiSWZ-Xk8DKxpiTnFqbxQmpvB0M01xNlDN7m4NDkeqDi1KDmxJD4_MRPBAWEjA3OjeENLS0sLE2Ny9AAAqaRDMA</recordid><startdate>2012</startdate><enddate>2012</enddate><creator>Pouyan, Peyman</creator><creator>Amat Bertran, Esteve</creator><creator>Rubio Sola, Jose Antonio</creator><general>IEEE Press. Institute of Electrical and Electronics Engineers</general><scope>XX2</scope></search><sort><creationdate>2012</creationdate><title>SRAM lifetime improvement by using adaptive proactive reconfiguration</title><author>Pouyan, Peyman ; Amat Bertran, Esteve ; Rubio Sola, Jose Antonio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-csuc_recercat_oai_recercat_cat_2072_1999843</frbrgroupid><rsrctype>text_resources</rsrctype><prefilter>text_resources</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Circuits integrats</topic><topic>Electrònica</topic><topic>Enginyeria electrònica</topic><topic>Integrated circuits</topic><topic>Microelectrònica</topic><topic>Àrees temàtiques de la UPC</topic><toplevel>online_resources</toplevel><creatorcontrib>Pouyan, Peyman</creatorcontrib><creatorcontrib>Amat Bertran, Esteve</creatorcontrib><creatorcontrib>Rubio Sola, Jose Antonio</creatorcontrib><collection>Recercat</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pouyan, Peyman</au><au>Amat Bertran, Esteve</au><au>Rubio Sola, Jose Antonio</au><format>book</format><genre>document</genre><ristype>GEN</ristype><btitle>SRAM lifetime improvement by using adaptive proactive reconfiguration</btitle><date>2012</date><risdate>2012</risdate><isbn>8362954434</isbn><isbn>9788362954438</isbn><abstract>Modern generations of CMOS technology nodes
are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging,
and effectively enlarges the SRAM lifetime.
Peer Reviewed</abstract><pub>IEEE Press. Institute of Electrical and Electronics Engineers</pub><oa>free_for_read</oa></addata></record> |
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| subjects | Circuits integrats Electrònica Enginyeria electrònica Integrated circuits Microelectrònica Àrees temàtiques de la UPC |
| title | SRAM lifetime improvement by using adaptive proactive reconfiguration |
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