SRAM lifetime improvement by using adaptive proactive reconfiguration

SRAM lifetime improvement by using adaptive proactive reconfiguration

Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced...

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Bibliographische Detailangaben
Hauptverfasser: Pouyan, Peyman, Amat Bertran, Esteve, Rubio Sola, Jose Antonio
Format: Text Resource
Sprache:eng
Schlagworte:
Circuits integrats
Electrònica
Enginyeria electrònica
Integrated circuits
Microelectrònica
Àrees temàtiques de la UPC
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Zusammenfassung:Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging, and effectively enlarges the SRAM lifetime. Peer Reviewed