The electrical losses induced by silver paste in n-type silicon solar cells

Aluminum-added silver paste (Ag/Al paste) has been used for p+ emitter of n-type solar cells. The electrical losses due to shunting and recombination caused by the paste in the cells have been reported to originate from huge metallic spikes due to the aluminum. However, whether the aluminum actually...

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Veröffentlicht in:Japanese Journal of Applied Physics 2017-10, Vol.56 (10), p.102302
Hauptverfasser: Aoyama, Takayuki, Aoki, Mari, Sumita, Isao, Yoshino, Yasushi, Ohshita, Yoshio, Ogura, Atsushi
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Sprache:eng
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Zusammenfassung:Aluminum-added silver paste (Ag/Al paste) has been used for p+ emitter of n-type solar cells. The electrical losses due to shunting and recombination caused by the paste in the cells have been reported to originate from huge metallic spikes due to the aluminum. However, whether the aluminum actually induces the losses has not been clarified yet. In this study, the "floating contact method is applied to aluminum-free silver (Al-free Ag) paste to investigate the effects of aluminum extraction from the Ag/Al paste and to understand how the aluminum principally induces the losses for the p+ emitter. Furthermore, the interfacial morphology between the Al-free Ag paste and p-type silicon is investigated. The Ag paste itself creates tiny crystallites for the p+ emitter, resulting in shunting and recombination. The result indicates that the aluminum addition to Ag paste is not the main reason for the electrical losses in the n-type solar cells.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.56.102302