Effects of Ge substitution on thermoelectric properties of CrSi 2

Polycrystalline Cr(Si 1− x Ge x ) 2 samples were prepared using arc melting and spark plasma sintering methods. Single-phase Cr(Si 1− x Ge x ) 2 samples were obtained for the compositional range of 0 ≤ x ≤ 0.015 and the lattice parameters monotonically increased with x . In the range of single phase...

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Veröffentlicht in:Japanese Journal of Applied Physics 2016-11, Vol.55 (11), p.111801
Hauptverfasser: Nagai, Hiroki, Takamatsu, Tomohisa, Iijima, Yoshihiko, Hayashi, Kei, Miyazaki, Yuzuru
Format: Artikel
Sprache:eng
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Zusammenfassung:Polycrystalline Cr(Si 1− x Ge x ) 2 samples were prepared using arc melting and spark plasma sintering methods. Single-phase Cr(Si 1− x Ge x ) 2 samples were obtained for the compositional range of 0 ≤ x ≤ 0.015 and the lattice parameters monotonically increased with x . In the range of single phases, the electrical conductivity and Seebeck coefficient increased and decreased with increasing x , respectively. The partial substitution of Ge effectively reduced the thermal conductivity to ∼80%, which resulted in the increase in the ZT of Cr(Si 1− x Ge x ) 2 samples from 0.16 ( x = 0) to 0.25 ( x = 0.015) at 600 K. From the results of first-principles calculation for transport properties, it can be concluded that the origin of the increase in electrical conductivity and the decrease in Seebeck coefficient of Ge-substituted samples is the decrease in carrier effective mass.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.55.111801