Fabrication of C-Doped p-AlGaInN Light-Emitting Diodes by the Insertion of Al 4 C 3
A C-doped p-AlGaInN light-emitting diode (LED) fabricated from III–V nitride was grown by metalorganic vapor phase epitaxy (MOVPE) by the insertion of Al 4 C 3 /Al 2 O 3 (0001). Al 4 C 3 /Al 2 O 3 (0001) with a size of 1×1 mm 2 was placed at the center of a 2-in. Al 2 O 3 (0001) substrate before gro...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2013-08, Vol.52 (8S), p.8 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A C-doped p-AlGaInN light-emitting diode (LED) fabricated from III–V nitride was grown by metalorganic vapor phase epitaxy (MOVPE) by the insertion of Al
4
C
3
/Al
2
O
3
(0001). Al
4
C
3
/Al
2
O
3
(0001) with a size of 1×1 mm
2
was placed at the center of a 2-in. Al
2
O
3
(0001) substrate before growing the LED. An InGaN/GaN multi quantum well (MQW) was used as an active layer. The concentrations of C and Si were different with the distance of Al
4
C
3
. Maximum C (
p
≧10
18
cm
-3
) and Si (
n
≧10
19
cm
-3
) intensities were observed at the edge and the half of center and edge on the grown wafer, respectively. The voltage of the C-doped AlGaInN LED was 6.9 V at 10 mA. The peak electroluminescence (EL) wavelength and the full-width at half-maximum (FWHM) were 395 nm and about 30 nm, respectively. It was clearly proven that u-Al
0.19
Ga
0.81
N became p-Al
0.19
Ga
0.81
N. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.7567/JJAP.52.08JG18 |